Title
Fast cancellation of sidelobes in the pattern of a uniformly excited array using external elements
Abstract
A method for wide null steering in the pattern of a uniformly excited linear array that utilizes the edge elements of the array is investigated. Simpler and faster algorithms for sidelobe reduction are introduced which use one or two external edge elements. Comparisons between these methods are held. Sample results are given.
Disciplines
Computer Engineering | Computer Sciences
Recommended Citation
El-Azhary, I., Afifi, M. S., & Excell, P. S. (1990)'Fast cancellation of sidelobes in the pattern of a uniformly excited array using external elements'. IEEE Transactions on Antennas and Propagation, 38(12), 1962-1965
Digital Commons Citation
El-Azhary, I; Afifi, M S.; and Excell, Peter S., "Fast cancellation of sidelobes in the pattern of a uniformly excited array using external elements" (1990). Computing. Paper 16.
http://epubs.glyndwr.ac.uk/cair/16

Comments
©1990 IEEE. Reprinted, with permission, from El-Azhary, I., Afifi, M. S., & Excell, P. S. "Fast cancellation of sidelobes in the pattern of a uniformly excited array using external elements". IEEE Transactions on Antennas and Propagation, Lightwave Technology, Journal of , vol.38, no.12, pp.1962-1965, Dec 1990. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. The definitive version is available at http://ieeexplore.ieee.org